The Open Surface Science Journal

2013, 5 : 9-16
Published online 2013 September 19. DOI: 10.2174/1876531901305010009
Publisher ID: TOSURSJ-5-9

Spectroscopic Ellipsometry Study of Co3O4 Thin Films Deposited on Several Metal Substrates

C. E. Barrera , J.C. Martínez-Flores , G.F. Gonzalez , M. Ortega-Lopez and R.C. Rosas
Departamento de Ingenieria de Procesos e Hidraulica, Universidad Autonoma Metropolitana – Iztapalapa, Av. Purísima Esq. Michoacán, Col. Vicentina, Mexico, D.F., 09340, Mexico.

ABSTRACT

Spectroscopic ellipsometry and atomic force microscope techniques were employed to analyze optical properties, microstructure and thickness of cobalt oxide thin films deposited on metal substrates by the sol-gel dipping method. The ellipsometric data were conveniently fitted, assuming a stratified structure for the deposited film, which consists of a sublayer native oxide that was coated with a bi-layered Co3O4 film. The dispersion curves (refractive indices and extinction coefficients) were reported in the 1.5–4.5 eV photon energy range. Excluding the Fe substrate, in which nucleation failed to grow Co3O4, all deposited films have the Co3O4 cobalt oxide phase as the predominant one. Additional data concerning solar parameters such as absorptance, emittance and selectivity of Co3O4/metal structures were also reported.

Keywords:

Spectroscopic ellipsometry, optical properties, cobalt oxide.